EH4电磁系统的近源效应及其校正方法

莫撼

doi:10.3969/j.issn.1000-8918.2000.04.012

EH4电磁系统的近源效应及其校正方法

文章导航 > 物探与化探 > 2000 > (4): 314-316,320

莫撼. EH4电磁系统的近源效应及其校正方法[J]. 物探与化探, 2000, (4): 314-316,320. doi: 10.3969/j.issn.1000-8918.2000.04.012

引用本文:

莫撼. EH4电磁系统的近源效应及其校正方法[J]. 物探与化探, 2000, (4): 314-316,320. doi: 10.3969/j.issn.1000-8918.2000.04.012

MO Han. SOURCE EFFECT OF EH4 ELECTROMAGNETIC SYSTEM AND TECHNIQUE FOR ITS CORRECTION[J]. Geophysical and Geochemical Exploration, 2000, (4): 314-316,320. doi: 10.3969/j.issn.1000-8918.2000.04.012

Citation:

MO Han. SOURCE EFFECT OF EH4 ELECTROMAGNETIC SYSTEM AND TECHNIQUE FOR ITS CORRECTION[J]. Geophysical and Geochemical Exploration, 2000, (4): 314-316,320. doi: 10.3969/j.issn.1000-8918.2000.04.012