X射线荧光光谱熔融片法测定超导材料原子数配比

X射线荧光光谱熔融片法测定超导材料原子数配比

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文章导航 > 岩矿测试 > 1997 > 16(2): 155-158

周军, 刘笛. X射线荧光光谱熔融片法测定超导材料原子数配比[J]. 岩矿测试, 1997, 16(2): 155-158.

引用本文:

周军, 刘笛. X射线荧光光谱熔融片法测定超导材料原子数配比[J]. 岩矿测试, 1997, 16(2): 155-158.

Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation[J]. Rock and Mineral Analysis, 1997, 16(2): 155-158.

Citation:

Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation[J]. Rock and Mineral Analysis, 1997, 16(2): 155-158.

X射线荧光光谱熔融片法测定超导材料原子数配比

周军,
刘笛

南京大学

基金项目:
国家自然科学基金

刊出日期: 1997-04-28

Determination of Atomic Ratio in Bi_K_Ba Superconductor by XRF with Fusion Disk Technique for Sample Preparation

Publish Date: 28 April 1997

摘要: 报道了用Ｘ射线荧光光谱测定铋钾钡系超导材料原子配比的方法。测量样片用熔融法制备，测定各组分的质量分数后计算原子配比并推出材料的分子式。
- X射线荧光光谱 /
- 铋钾钡超导材料 /
- 原子数配比 /
- 熔融片
Abstract: A method for the determination of atomic ratio in Bi_K_Ba superconductor by XRF with fusion disk technique for sample preparation was developed. Atomic ratio was calculated after the mass fraction for each component was determined. The molecular formula o
- X_ray /
- fluorescence /
- spectrometry(XRF) /

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