参加第49届丹佛X射线年会有感

修回日期: 2000-12-04

刊出日期: 2001-02-28

Views on the 49th Denver Annual X-Ray Conference

Revised Date: 04 December 2000

Publish Date: 28 February 2001

摘要: 报道了第49届丹佛X射线年会的概况。会议期间,痒于微束装置及其分析技术、全反射技术与应用、探测器研制、薄层分析、样品制备、半导体材料分析等，受到广泛关注。
- X射线分析会议 /
- 微束装置 /
- 全反射技术 /
- 探测器 /
- 薄层分析 /
- 半导体材料
Abstract: The 49th Denver Annual X ray Conference is overviewed in this paper. The attention of the conference is paid to the trends and developments in micro beam techniques, total reflection X ray fluorescence analysis, new X ray detector developments, film a
- Denver /
- Annual /
- X-ray /
- Conference /
- overview