近红外反射光谱学在岩石矿物研究中的应用Ⅱ.快速测定地质样品中有机质

修回日期: 2003-05-07

刊出日期: 2004-02-28

Revised Date: 07 May 2003

Publish Date: 28 February 2004

摘要: 利用偏最小二乘法回归的多变量校正方式,建立了应用近红外反射光谱学方法无损快速测定各种地质样品中有机质的模型.设计了多重散射光校正、标准正常变量转换及导数光谱,扣除额外基线和重叠信号的影响,分离出与有机质含量有关的光谱信息.大多数地质样品的有机质近红外反射光谱估算结果与化学法符合.
- 近红外反射光谱学 /
- 有机质 /
- 地质样品 /
- 偏最小二乘回归法 /
- 二阶导数光谱
Abstract: A quicker method is developed based on a multivariate calibration procedure using partial least squares (PLS) regression to establish a relationship between the organic matter content in geological samples determined by conventional chemical measurements
- near-infrared /
- (NIR) /
- reflectance /
- spectroscopy /
- organic