X射线荧光光谱法测定多目标地球化学调查样品中主次痕量组分

修回日期: 2003-03-10

刊出日期: 2004-02-28

Determination of 25 Major, Minor and Trace Elements in Geochemical Exploration Samples by X-Ray Fluorescence Spectrometry

Revised Date: 10 March 2003

Publish Date: 28 February 2004

摘要: 采用低压聚乙烯镶边垫底的粉末样品压片制样,用PW2440X射线荧光光谱仪对多目标地球化学调查样品中Na2O、MgO、Al2O3、SiO2、P、K2O、CaO、Ti、Mn、Fe2O3、Co、Nb、Zr、Y、Sr、Rb、Pb、Th、Zn、Cu、Ni、V、Cr、Ba、La等组分进行测定。重点讨论了微量元素的背景选择和谱线重叠校正问题。使用经验系数法和康普顿散射线作内标校正基体效应,经标准物质分析检验,结果与标准值吻合,用GBW07308和GBW07310水系沉积物国家一级标准物质作精密度试验,统计结果RSD(n
- 化探样品 /
- X射线荧光光谱仪 /
- 背景位置选择 /
- 谱线重叠校正 /
- 粉末样品压片
Abstract: A method for direct determination of Na_(2)O, MgO, Al_(2)O_(3), SiO_(2), P, K_(2)O, CaO, Ti, V, Cr, Mn,( Fe_2O_3,) Co, Ni, Cu, Pb, Zn, Nb, Zr, Y, Sr, Rb, Th, Ba and La in geochemical exploration samples by XRF with sample preparation of pressed powder pel
- geochemical /
- exploration /
- sample /
- PW2440 /
- X-ray