原子荧光光谱法测定铟中锡

收稿日期: 2004-12-15

刊出日期: 2005-06-28

Determination of Trace Tin in Indium by Atomic Fluorescence Spectrometry

Received Date: 15 December 2004

Publish Date: 28 June 2005

摘要: 试验了采用原子荧光光谱法测定铟产品中锡时,以EDTA为络合剂掩蔽铟,利用EDTA与铟和锡形成络合物的稳定常数不同,克服基体铟对锡的正向干扰;优化了仪器测定条件,测定范围w(Sn)为0.001%~1.00%,标准加入回收率为99%~105%。所拟方法用于铟产品中锡的测定,结果与苯基荧光酮比色法和碘量法相符。8次独立分析的精密度(RSD)为2.4%~10%。
- 锡 /
- 原子荧光光谱法 /
- 正向干扰 /
- 铟
Abstract: Experiments were conducted to optimize the conditions of tin analysis in indium products by atomic fluorescence spectrometry. EDTA was used as complex reagent to mask indium in diluted HCl medium. The interference from matrix element indium could be elimi
- indium /
- atomic /
- fluorescence /
- spectrometry