波长色散X射线荧光光谱法同时测定钨精矿中主次量组分

收稿日期: 2009-06-10

修回日期: 2009-08-25

刊出日期: 2010-04-28

Determination of Major and Minor Components in Tungsten Concentrates by Wavelength Dispersive Xray Fluorescence Spectrometry

Received Date: 10 June 2009

Revised Date: 25 August 2009

Publish Date: 28 April 2010

摘要: 建立了采用波长色散X射线荧光光谱测定钨精矿中三氧化钨、锰、铁、氧化钙、二氧化硅、锡、钼、铜、铋、铅、锑、锌、镉、铬等14个主次量组分的方法。采用四硼酸钠和四硼酸锂混合熔剂熔融制样，以高纯物质人工配制校准标准样品，公共背景法进行背景校正，采用可变理论α影响系数法校正基体效应。方法的准确性、精密度达到了传统分析方法的要求，分析时间大大缩短，具有较好的实用价值。
- X射线荧光光谱法； /
- 熔融制样； /
- 主次量组分； /
- 钨精矿
Abstract: A new method has been developed for the determination of 14 components including WO3, Mn, Fe, CaO, SiO2, Sn, Mo, Cu, Bi, Pb, Sb, Zn, Cd and Cr in tungsten concentrates by wavelengthdispersive X-ray fluorescence spectrometry. The samples were fused with mixture flux of Na2B4O7and Li2B4O7(65∶35) and the calibration samples were artificially synthesized with high purity compounds. The common background method was used for background calibration and the variable theoretical αcoefficient method was used for matrix effect calibration. The method provides the advantages of high accuracy, high precision, high efficiency and has been applied to the routine analysis of tungsten concentrates.
- X-ray /
- fluorescence /
- spectrometry /