X射线荧光光谱法测定长石的化学成分

修回日期: 1998-10-14

刊出日期: 1999-06-28

Chemical Component Analysis of Feldspar by X-ray Fluorescence Spectrometry

Revised Date: 14 October 1998

Publish Date: 28 June 1999

摘要: 采用粉末压片制样、Ｘ射线荧光光谱仪测定长石的化学组成，可获得高准确度和高精度度的分析结果，测定值与化学法及推荐值相符，重复１０次测定主，次量组分的ＲＳＤ〈０．６％，痕量组分ＲＳＤ〈３％。方法简便快捷，分析时间仅为传统湿法化学分析的１／８，满足工艺过程中批次配料需要。
- 粉末压片 /
- X射线荧光光谱 /
- 长石 /
- 化学成分
Abstract: The chemical components of feldspar were analyzed by Xray fluorescence spectrometry with powder pellet sample preparation method. The results provided by this method are in agreement with certified values and with those provided by classical chemical meth
- powder /
- pellet /
- sample /
- preparation